The emission microscopy is a tool used to search for hot spots. It has high sensitivity sensors that can detect the photons emitted by the recombination of electrons and electron holes, as well as the thermal radiation distribution excited by hot carriers. Therefore, the emission microscopy is mainly used to locate failure site in failure analysis. The commonly used emission microscopy include C-CCD emission microscopy, InGaAs emission microscopy and OBIRCH, which are destructive, as well as non-destructive InSb thermal emission microscopy.

Application
Integrated Circuits, Transistors, Sensors, Photovoltaic Components, etc